Product ID # - T1508
Product Information
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| Description: | Process Technology: | |||
| Configured for 200mm Wafers (two 6” or 8” Cassette Stations)
Manufactured 2000 Serviced by OEM While In Production Original Spec of 4nm at 1KV with SEM Perspective Imaging High Resolution Color Optical Microscope SEM 45 Degree Tilt Automated Review Flow Color MPSI for Enhanced Topography & Material Information. SYSTEM OPTION Integrated EDX Spectrometer Integrated Energy Dispersive X-Ray Spectrometer (Nitrongen Free Cooling) SEM Based ADC Package Remote Workstation – ability to perform off-line tasks such as Results Analysis and off-line classification. SECS-II GEM |
Make: AMAT | |||
| Model: SEM Vision CX | ||||
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| Mfg Year: 1998 | ||||
| Date Available: 02-19-2009 | ||||
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