Product ID # - T1284
Product Information
|
||||
| Description: | Process Technology: SEM & FIB | |||
| Applied Materials SEMVision
- Wafer size 200 mm and 300 mm - Automatic Dual-beam Integrated Defect Review and Classification SEM w/integrated Focus Ion-beam - G2 FIB - DR SEM - GaAs source - SEM column rotate 0 - 45 degrees - Brightfield - 2x, 20x & 100x - Darkfield - 20x & 100x - EDX detector with cold head (IGC Poly Cold) - FIB - Metal etch, Metal dep, Ins etch, Ins dep - Mfg 2003 - CE mark - Pumps - B/E QDP 80 & QDP 40 - UPS - Chiller - Hakais - Cryo - Tiger IGC APD - Manuals - User, PM, Startup - Sources - Nine 5 gal pails - Located in a clean room |
Make: AMAT - Applied Materials | |||
| Model: Semvision G2 FIB | ||||
| Serial #: | ||||
| Wafer Size: 200mm | ||||
| Part #: | ||||
| Mfg Year: 2003 | ||||
| Date Available: 05-30-2008 | ||||
Images Associated with this product |
||
| There are no images assigned to this product. |
Please fill out your contact information below and a representative will be in contact shortly. If you wish to inquire about multiple products, please click here. Thank You!
