EQUIPMENT DETAILS:
AIT 2 Patterned Wafer Inspection System:
- Multi-Spot Optics (5um, 7um and 10um spot sizes)
- Advanced Collection Optics Configuration
- Internal Microscope Review Including:
- Integrated Optical Microscope
- 4 Microscope Objectives Standard (10, 50, 100, 150X)
- Bright Field/Dark Field Viewing
- Auto Focus capability
- Automatic Coordinate Registration and Alignment
- Region Based Multi-Threshold Capability (RBMT)
- Integrated ULPA Filter Package
- High Resolution Color Monitor
- Standard Network Communication Capability:
* Supports Windows NT 4.0 File and Printer Connections
- Supports 10Base-T and BNC (10Base-2)
- Robot Protective Cover
- Low Contact Vacuum Chuck/Locator for 200mm
- "Clean-room White" Tool Skins
- 200mm Dual Paddle Robotic Handler, Single Cassette Platform
UPDGRADE IN 2002:
- 1ea P/N 0027212-000 Field Upgrade Kit, AIT-II to AIT-XP.
-Including:
- 1ea P/N 0037910-000 Upgrade 3 spot Size AIT-II to AIT-XP 3.5um, 5um, 7um.
UPGRADE IN 2003:
- P/N 00190101-000 GEM/SECS and HSMS Interface
Darkfield Inspection
• Currently Configured for 6" wafer size